Article
IEEE 1057 Jitter Test of Waveform Recorders
IEEE Transactions on Instrumentation and Measurement
— 2009
Key information
Authors:
Published in
July 2009
Abstract
The jitter test of waveform recorders and analog to- digital converters (ADCs) is traditionally carried out using one of the methods recommended in the IEEE standard for digitizing waveform recorders, i.e., IEEE Standard 1057. Here, we study the uncertainty of one of those methods, point out the bias inherent to the estimator recommended for measuring the ADC jitter, and suggest an alternate estimator. Expressions are also presented for the determination of the precision of a given estimate from the number of samples used, the standard deviation of the additive noise present in the test setup, the jitter standard deviation, and the stimulus signal parameters. In addition, an expression for the computation of the minimum number of samples required to guarantee a given bound on the estimation uncertainty is presented, which is useful in optimizing the duration of the test.
Publication details
Authors in the community:
Francisco André Corrêa Alegria
ist13902
António Manuel da Cruz Serra
ist11791
Title of the publication container
IEEE Transactions on Instrumentation and Measurement
First page or article number
2234
Last page
2244
Volume
58
Issue
7
Fields of Science and Technology (FOS)
electrical-engineering-electronic-engineering-information-engineering - Electrical engineering, electronic engineering, information engineering
Publication language (ISO code)
eng - English
Rights type:
Open access