Article

Random noise test of ADCs with a sinusoidal stimulus

World Journal of Advanced Engineering and Technology

Francisco André Corrêa Alegria — 2023 — Magna Scientia

Key information

Authors:

Francisco André Corrêa Alegria (Francisco André Corrêa Alegria)

Published in

June 6, 2023

Abstract

The recommended random noise test for analogue to digital converters (ADCs), as stated in the IEEE 1057 Standard for Digitizing Waveform Recorders, suggests the utilization of a triangular signal as the stimulus for the ADC under examination. However, we will demonstrate that an alternative option of employing a sinusoidal stimulus signal is equally feasible. This substitution provides enhanced flexibility during the testing process and enables the utilization of sine fitting algorithms.

Publication details

Authors in the community:

Publisher

Magna Scientia

Title of the publication container

World Journal of Advanced Engineering and Technology

First page or article number

220

Last page

227

Volume

9

Issue

1

ISSN

2456-1940

DOI

10.30574/wjaets.2023.9.1.0166

Fields of Science and Technology (FOS)

electrical-engineering-electronic-engineering-information-engineering - Electrical engineering, electronic engineering, information engineering

Keywords

  • Analogue to Digital Converter
  • Random Noise Test
  • Sine Wave

Publication language (ISO code)

eng - English

Rights type:

Open access

Creative Commons license

CC-BY - Attribution