XPS studies of directly fluorinated HDPE: Problems and solutions

Ferraria A.M.; Lopes da Silva J.D.; Botelho do Rego A.M.

Key information

Authors:

Ferraria A.M. (Ana Maria da Conceição Ferraria); Lopes da Silva J.D.; Botelho do Rego A.M. (Ana Maria Pereira Lopes Redondo Botelho do Rego)

Published in

10/17/2003

Abstract

X-ray photoelectron spectroscopy (XPS) applied to the study of fluorinated polymer surfaces presents several problems related both to peak assignment and to degradation. In this work, we analyse extensively the question of XPS peak assignments in this kind of surfaces. We conclude that in this kind of surfaces using binding energy differences between fluorine and carbon is better than using absolute binding energies. Also a useful relation between fluorine photoelectron energy vs. polymer composition expressed through the atomic ratio fluorine/carbon (F/C) was found. A protocol for data treatment is proposed and applied to a XPS study of the degradation induced by X-ray on high-density polyethylene surfaces modified by direct fluorination. Results obtained for the degradation, namely the atomic ratio F/C obtained by two different methods, combined with angle resolved X-ray photoelectron spectroscopy (ARXPS) were used to study the fluorine concentration profile in depth, producing self-consistent results.