A general artificial neural network for analysis of RBS data of any element with Z between 18 and 83 implanted into any lighter one- or two-element target

Junho 2004

We report a generalisation of previous works where artificial neural networks (ANNs) were successfully applied for specific implantations such as Er in sapphire or Ge in Si. We have now developed a code that it is able to analyse data from implantations of any element with Z between 18 and 83 into any target composed of one or two lighter elements. Although this problem is considerably more complex than single-system ANNs, the ANN developed produced excellent results when applied to experimental data. (C) 2004 Elsevier B.V. All rights reserved.

Autores da comunidade :

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  N

  Nuno Pessoa Barradas

  ist25378

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

105

109

219

physical-sciences - Física

eng - Inglês