Bias of the independently based gain and offset error in ADC testing using the histogram method

August 2023

When normally distributed additive noise is present on the test setup, it leads to a bias on the values of estimated gain and offset error of analog-to-digital converters when estimated using the Histogram Test Method. It is shown that the offset estimation is unbiased while the gain estimation can have up to 5% bias for values of signal-tonoise ratio as low as 10 dB. It is also shown that this bias is not dependent on the number of samples acquired. An approximate analytical expression, in closed form, is proposed for rapid estimation of gain error. It considers the signal-to-noise ratio as well as the amount of overdrive used. The analytical derivations made are validated using simulated data using a Monte Carlo procedure. The same procedure is used with experimental data obtained with a real data acquisition system to validate the results obtained.

Authors in the community:

• 

  F

  Francisco André Corrêa Alegria

  ist13902

  Affiliations and sources

  IST > IT

  Instituto de Telecomunicações

  IST > DEEC

  Departamento de Engenharia Electrotécnica e de Computadores

AM - Accepted manuscript

Elsevier

https://www.sciencedirect.com/science/article/pii/S0263224123007455?via%3Dihub

Measurement

218

10.1016/j.measurement.2023.113181

electrical-engineering-electronic-engineering-information-engineering - Electrical engineering, electronic engineering, information engineering

Keywords

• Measurement
• Analog-to-digital converters
• Testing

eng - English