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TEM and XRD investigation of MnO$_{2}$ microstructure and its influence on ESR of Ta capacitors

Materials Science Forum

Dias D.; Monteiro R.; Lohwasser W. — 2006

Key information

Authors:

Dias D.; Monteiro R.; Carvalho P.A.; Ferro A.C. (Alberto Eduardo Morão Cabral Ferro); Lohwasser W.

Published in

01/01/2006

Publication details

Authors in the community:

Title of the publication container

Materials Science Forum

First page or article number

269

Last page

273

Volume

514-516

Issue

PART 1

ISBN

9780878494026

DOI

10.4028/www.scientific.net/MSF.514-516.269

Fields of Science and Technology (FOS)

materials-engineering - Materials engineering

Publication language (ISO code)

eng - English

Rights type:

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