Article

Linearity Test of Triangular Waveform Generators

Francisco André Corrêa Alegria; Francisco Alergia — 2023

Key information

Authors:

Francisco André Corrêa Alegria (Francisco André Corrêa Alegria); Francisco Alergia

Published in

June 7, 2023

Abstract

This paper presents a novel approach for accurately testing triangular waveform generators by leveraging the Ramp Vernier Test methodology commonly used for Analog-to-Digital Converters (ADCs). The proposed procedure enables efficient measurement of the nonlinearity of a triangular waveform using a low-cost data acquisition board. The key idea is to utilize the waveform generator under test to produce the stimulus signal for the data acquisition system's testing. By analyzing the results of this test, the nonlinearity of the acquisition system can be determined and subsequently corrected. This innovative approach effectively liminates the influence of the acquisition system's nonlinearity on the estimation of the nonlinearity of the aveform generator, ensuring accurate and reliable measurements.

Publication details

Authors in the community:

Publication version

AO - Author's Original

Fields of Science and Technology (FOS)

electrical-engineering-electronic-engineering-information-engineering - Electrical engineering, electronic engineering, information engineering

Keywords

  • Instrumentation
  • Measurement
  • Analog-to-Digital Testing
  • Histogram Method

Publication language (ISO code)

eng - English

Rights type:

Open access