Article
Choosing optimal input and sampling frequencies for analog to digital converter testing
Journal
— 2023
Key information
Authors:
Published in
July 1, 2023
Abstract
The main objective of this paper is to study of the ideal input and sampling frequencies, as well as determining the necessary number of samples for achieving coherent sampling. This aspect holds significant importance when it comes to testing analog-to-digital converters (ADCs) using various techniques such as the Histogram Test Method, Discrete Fourier Transform Method, or Sine-Fitting Method. The study conducted in this paper sheds light on a crucial consideration, which is the trade-off between testing duration and the proximity to the required frequencies. This trade-off is determined by the number of acquired samples. The balance between the amount of time spent on testing and the accuracy achieved in terms of the frequencies being targeted is of great importance. By exploring the ideal input and sampling frequencies, along with the determination of the necessary number of samples for coherent sampling, this research contributes to enhancing the understanding of ADC testing methodologies. It provides valuable information for researchers and practitioners in the field, enabling them to make informed decisions regarding the selection of appropriate testing techniques and algorithms based on their specific requirements and constraints. Ultimately, the findings presented in this paper have the potential to improve the efficiency and effectiveness of ADC testing processes, leading to more accurate and reliable results.
Publication details
Authors in the community:
Francisco André Corrêa Alegria
ist13902
Publication version
AM - Accepted manuscript
Link to the publisher's version
https://wjaets.com/content/choosing-optimal-input-and-sampling-frequencies-analog-digital-converter-testing
Title of the publication container
Journal
First page or article number
124
Last page
137
Volume
9
Issue
2
Fields of Science and Technology (FOS)
electrical-engineering-electronic-engineering-information-engineering - Electrical engineering, electronic engineering, information engineering
Keywords
- analog-to-digital converters
- testing
Publication language (ISO code)
eng - English
Rights type:
Only metadata available