Article In: orcid

Test preparation and fault analysis using a bottom-up methodology

Proceedings - IEEE International Symposium on Circuits and Systems

Gracio, J.A.; Bicudo, P.A.; Teixeira, J.P. — 1989

Key information

Authors:

Gracio, J.A.; Bicudo, P.A.; Rua, N.N.; Oliveira, A.M. (Arlindo Manuel Limede de Oliveira); Almeida, C.F.B.; Teixeira, J.P.

Published in

1989

Publication details

Authors in the community:

Title of the publication container

Proceedings - IEEE International Symposium on Circuits and Systems

First page or article number

168

Last page

174

Volume

2

Fields of Science and Technology (FOS)

computer-and-information-sciences - Computer and information sciences

Publication language (ISO code)

eng - English

Rights type:

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